Fuzzing Deep Learning Compilers with HirGen
Deep Learning (DL) compilers are widely adopted to optimize advanced DL models for efficient deployment on diverse hardware.
Their quality has a profound effect on the quality of compiled
DL models. A recent bug study shows that the optimization of
high-level intermediate representations (IRs) is the most error-prone
compilation stage and bugs in this stage account for 44.92% of the
whole collected ones. However, existing testing techniques do not
consider the features related to high-level optimization (e.g., the
high-level IR), and are therefore weak in exposing bugs at this stage.
To bridge this gap, we propose HirGen, an automated testing technique that effectively exposes coding mistakes in the optimization
of high-level IRs. The design of HirGen includes 1) three coverage
criteria to generate diverse and valid computational graphs; 2) the
use of the high-level IR’s language features to generate diverse IRs;
3) three test oracles of which two are inspired by metamorphic
testing and differential testing. HirGen has successfully detected
21 bugs that occur at TVM, with 17 bugs confirmed and 12 fixed.
Further, we construct four baselines using state-of-the-art DL compiler fuzzers that can cover the high-level optimization stage. Our
experiment results show that HirGen can detect 10 crashes and
inconsistencies that cannot be detected by the baselines in 48 hours.
We also evaluate the usefulness of our proposed coverage criteria
and test oracles.
Wed 19 JulDisplayed time zone: Pacific Time (US & Canada) change
13:30 - 15:00
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Karine Even-Mendoza King’s College London, Arindam Sharma Imperial College London, Alastair F. Donaldson Imperial College London, Cristian Cadar Imperial College LondonDOI
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Haoyang Ma Hong Kong University of Science and Technology, Qingchao Shen Tianjin University, Yongqiang Tian University of Waterloo, Junjie Chen Tianjin University, Shing-Chi Cheung Hong Kong University of Science and TechnologyDOI