ISSTA 2017 (series) / Shin Yoo
Registered user since Fri 9 Jun 2017
Name:Shin Yoo
Country:Korea, South
Affiliation:Korea Advanced Institute of Science and Technology
Contributions
| ISSTA 2017 | FLUCCS: Using Code and Change Metrics to Improve Fault Localization | ||||||||||||||||||||||||||||||||||||||||
| Show activities from other conferences | |||||||||||||||||||||||||||||||||||||||||
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