Graph-based Fuzz Testing for Deep Learning Inference EnginesTechnical Track
Wed 26 May 2021 23:20 - 23:40 at Blended Sessions Room 2 - 2.1.2. Deep Neural Networks: Quality Assurance
With the wide use of Deep Learning (DL) systems, academy and industry begin to pay attention to their quality. Testing is one of the major methods of quality assurance. However, existing testing techniques focus on the quality of DL models but lacks attention to the core underlying inference engines (i.e., frameworks and libraries). Inspired by the success stories of fuzz testing, we design a graph-based fuzz testing method to improve the quality of DL inference engines. This method is naturally followed by the graph structure of DL models. An operator-level coverage based on graph theory is introduced and six different mutations are implemented to generate diversified DL models by exploring combinations of model structures, parameters, and data. The Monte Carlo Tree Search (MCTS) is used to drive DL model generation without a training process. The experimental results show that the MCTS outperforms the random method in boosting operator-level coverage and detecting exceptions. Our method has discovered more than 40 different exceptions in three types of undesired behaviors: model conversion failure, inference failure, output comparison failure. The mutation strategies are useful to generate new valid test inputs, by up to an 8.2% more operator-level coverage on average and 8.6 more exceptions captured.
Graph-based fuzz testing for deep learning inference engines (video) (presentation_compressed.mp4) | 18.14MiB |
Wed 26 MayDisplayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change
11:20 - 12:20 | 2.1.2. Deep Neural Networks: Quality AssuranceTechnical Track at Blended Sessions Room 2 +12h Chair(s): Gregorio Robles Universidad Rey Juan Carlos | ||
11:20 20mPaper | Graph-based Fuzz Testing for Deep Learning Inference EnginesTechnical Track Technical Track Weisi Luo I&V Dept of Kirin Solution Dept, HS, Huawei, Xiaoyue Run I&V Dept of Kirin Solution Dept, HS, Huawei, Dong Chai I&V Dept of Kirin Solution Dept, HS, Huawei, Jiang Wang I&V Dept of Kirin Solution Dept, HS, Huawei, Chunrong Fang Nanjing University, Zhenyu Chen Nanjing University Pre-print Media Attached File Attached | ||
11:40 20mPaper | RobOT: Robustness-Oriented Testing for Deep Learning SystemsTechnical Track Technical Track Jingyi Wang Zhejiang University, Jialuo Chen Zhejiang University, Youcheng Sun Queen's University Belfast, UK, Xingjun Ma Deakin University, Dongxia Wang Zhejiang University, Jun Sun Singapore Management University, Singapore, Peng Cheng Zhejiang University Pre-print Media Attached | ||
12:00 20mPaper | Scalable Quantitative Verification For Deep Neural NetworksTechnical Track Technical Track Teodora Baluta National University of Singapore, Zheng Leong Chua Independent Researcher, Kuldeep S. Meel National University of Singapore, Prateek Saxena National University of Singapore Pre-print Media Attached |
23:20 - 00:20 | |||
23:20 20mPaper | Graph-based Fuzz Testing for Deep Learning Inference EnginesTechnical Track Technical Track Weisi Luo I&V Dept of Kirin Solution Dept, HS, Huawei, Xiaoyue Run I&V Dept of Kirin Solution Dept, HS, Huawei, Dong Chai I&V Dept of Kirin Solution Dept, HS, Huawei, Jiang Wang I&V Dept of Kirin Solution Dept, HS, Huawei, Chunrong Fang Nanjing University, Zhenyu Chen Nanjing University Pre-print Media Attached File Attached | ||
23:40 20mPaper | RobOT: Robustness-Oriented Testing for Deep Learning SystemsTechnical Track Technical Track Jingyi Wang Zhejiang University, Jialuo Chen Zhejiang University, Youcheng Sun Queen's University Belfast, UK, Xingjun Ma Deakin University, Dongxia Wang Zhejiang University, Jun Sun Singapore Management University, Singapore, Peng Cheng Zhejiang University Pre-print Media Attached | ||
00:00 20mPaper | Scalable Quantitative Verification For Deep Neural NetworksTechnical Track Technical Track Teodora Baluta National University of Singapore, Zheng Leong Chua Independent Researcher, Kuldeep S. Meel National University of Singapore, Prateek Saxena National University of Singapore Pre-print Media Attached |